Archive for the ‘Unit Testing’ Category

Embedded Memory Constraints and TDD

Tuesday, November 10th, 2009

Constrained Memory is the reality for many embedded developers. Running tests in the development system won’t suffer the same memory constraints found in the target. Here are a few things to help TDD in constrained memory situations.
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Why Test Driven Development for Embedded?

Wednesday, October 7th, 2009

Embedded software has all the challenges of “regular” software, like poor quality and unreliable schedules. It is just software with some additional challenges. The additional challenges do not disqualify TDD for embedded. TDD even helps with some of those uniquely embedded challenges.
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What Should you Expect from a Unit Test Harness

Tuesday, October 6th, 2009

A unit test harness’ job is to provide:

  • A concise common language to express test cases
  • A concise common language to express expected results
  • A place to collect all the unit test cases for the project, system, or subsystem
  • The facilities to run the test cases, either in full or partial batches
  • A concise report of the test suite success or failure
  • A detailed report of any test failures